Chemistry 312 Spring 2007. Homework #8 Deadline Monday May 7th 2007.

Solids and surfaces.

1. Briefly explain the basic principles and describe the quantitative analytical applications of X-ray fluorescence spectrometry. Include in your explanation something about TXRF and explain why this version of the technique can detect low concentrations.

2. Briefly explain the basic principles and qualitative analytical applications of X-ray crystallography.

3. Explain the basic principles of the following techniques, which can be used to characterize the surfaces of materials: X-ray photoelectron spectrometry (sometimes called electron spectrometry for chemical analysis--ESCA), Auger electron spectrometry, and electron microscopy (with electron probe micro-analysis capabilities). For each of the three techniques indicate what information can be obtained.

Most textbooks dealing with instrumental analysis will have sections about each of these topics. Whatever sources you use, please cite the full reference. Don’t forget to use the ACS format for websites: Author (if any). Title of Site. URL (accessed date), other identifying information. For example, U.S. Environmental Protection Agency Home Page. http://www.epa.gov (accessed April 2007).